Ключевые слова: magnets, quench detection, quench protection, HTS, Bi2223, coils, design parameters, test results
Ключевые слова: LTS, NbTi, magnets, conduction cooled systems, quench protection, cryocoolers, quench detection, experimental results
Ключевые слова: HTS, Bi2223/Ag, coils, quench detection, quench protection, design parameters, experimental results
Ключевые слова: measurement technique, acoustic emission, HTS, coils, Bi2223, design parameters, insulating medium, crack formation, experimental results
Ключевые слова: NbTi, LTS, conduction cooled systems, magnets, quench detection, quench protection, design parameters, experimental results
Ключевые слова: HTS, coils, quench detection, quench protection, acoustic emission, normal zone propagation, Bi2223, design parameters, experimental results
Ключевые слова: quench protection, HTS, Bi2223, tapes, coils, multilayered structures, experimental results
Ключевые слова: quench protection, HTS, coils, measurement technique, recovery characteristics, experimental results
Ключевые слова: HTS, coils, quench properties, modeling, normal zone propagation, YBCO, coated conductors, experimental results
Tachikawa K., Nishijima G., Watanabe K., Yamada Y., Murase S., Kim S.B., Nanato N., Nitta A., Kuwashima H.
Kikuchi A., Nishijima G., Watanabe K., Kim S., Banno N., Takeuchi T., Murase S., Nanato N., Takeuchi K.
Ключевые слова: LTS, coils, conduction cooled systems, quench protection, Nb3Al, experimental results, power equipment
Tachikawa K., Miyagi D., Yamada Y., Takahashi N., Murase S., Kim S.B., Ohzawa T., Nanato N., Nitta A.
Ключевые слова: HTS, quench protection, Bi2223, tapes, coils pancake, experimental results, power equipment
Ключевые слова: magnetic separation, magnetic systems, numerical analysis, model small-scale, experimental results
Ключевые слова: MgB2/Ni, tapes, transport currents, ac losses, critical current, temperature dependence, experimental results, critical caracteristics
Hyun O.B., Murase S., Kim S.B.(kim@elec.okayama-u.ac.jp), Nanato N., Watanabe J.
Yamada Y., Hirabayashi I., Araki T., Murase S., Kim S.B.(kim@elec.okayama-u.ac.jp)
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